Nio Xrd

It can be seen from figure 1 that the diffraction peaks are low and broad due to the small size effect and incomplete inner structure of the particle.

Nio xrd. The strong diffraction peaks indicated that nio nanosheets were highly crystallized. All of the reflections in the xrd pattern can be indexed to face centered cubic phase nio jcpds card no. A carbon analyzer leco carbon sulfur analyzer cs744 was used to determine the carbon content of the washed precipitate ni and nio nanoparticles. Fig 2 shows that the nio nanoparticles calcined at 500 oc temperature exhibit high crystalline quality than samples before calcinations.

Nio is halite rock salt structured and crystallizes in the cubic fm 3m space group. The three characteristic peaks at 37 2 43 2 and 62 8 correspond to the 111 200 and 220 diffraction planes respectively. The xrd pattern of the nio nanosheets matched well with the standard nio jcpds 47 1049 fig. Typical xrd patterns of the annealed nio nanosheets are shown in figure 4.

The crystallization of ni nio pdda g was examined by xrd as shown in figure 1 the peaks of the 002 plane in the pdda modified graphene was shifted from 20 5 to 22 which revealed the change in the layer to layer distance of graphene due to incorporation of pdda the hydrothermal method for synthesis of the ni nio alloy nanoparticles was one pot synthesis with a. O2 is bonded to six equivalent ni2 atoms to form a mixture of corner and edge. The structure is three dimensional. X ray diffraction xrd bruker d8 advance using cu kα radiation was used to examine the crystalline compounds crystalline structure and crystallite size of the samples.

All ni o bond lengths are 2 10 å. The corner sharing octahedral tilt angles are 0. The x ray diffraction xrd profile taken from the synchrotron beam shows the presence of relaxed grains of nio in addition to the strained grains where the fraction of relaxed grains gradually. Hydrogen reduction of porous bulk nio particles has been studied with in situ hot stage x ray diffraction xrd in the temperature range 175 300 c.

This technique has the ability to measure nio disappearance and ni appearance simultaneously together with the crystallite size of each. The average size of the nio nanoparticle indexing to the 111 plane observed from x ray diffraction xrd pattern is 26 nm. The characterized nio nanostructures were uniform dense and polycrystalline in the crystal phase. In addition to this the nio nanostructures were used in the.

X ray pattern of nio nanoparticle a before and b after calcination.